webinar How Peers are Tackling CECL for Held-to-Maturity Securities Join experts from RiskSpan and Grant Thornton to learn about the new current expected credit loss standard (CECL) and it’s implications for held-to-maturity securities. In this webinar, they will: Identify defining major classes in the debt securities universe including structured-finance, corporate bonds and MUNI bonds. Introduce CECL approaches for these classes, looking at both advanced and simpler approaches Apply the general CECL model to debt securities and look at the impact on pooling and zero credit losses About The Hosts Dave Andrukonis Director – RiskSpan David Andrukonis, CFA leads RiskSpan’s banking line of business, which helps lending institutions efficiently measure, optimize, and report the risk in their portfolios. Formerly, David managed the credit risk analyst group at WashingtonFirst Bank, covering CRE, construction, C&I and residential portfolios. David has published three technical papers in the RMA Journal and is a CFA Charterholder. Graham Dyer Partner – Grant Thornton, Member – FASB’S CECL Transition Resource Group (TRG) Graham Dyer currently consults with Grant Thornton’s clients and audit teams regarding technical accounting and auditing matters, with a focus on issues impacting financial services entities. His background includes the National Professional Standards Group at Grant Thornton and serving as a Professional Accounting Fellow in the Office of the Chief Accountant at the OCC. Graham is also a member of the FASB’s CECL Transition Resource Group (TRG) and the IASB’s IFRS 9 Impairment Transition Group (ITG). Varum Agaewal Director, Strategic Risk and Operations Practice, Financial Services Varun Agarwal provides advisory services to Banking and Capital Markets clients in risk and regulatory compliance management space in the areas of Enterprise Risk, Credit Risk, Market Risk, Liquidity Risk, Operational Risk and Model Risk management services along with Risk Governance, Risk Data Management and Reporting services.